Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices-Reference-Cited by-同舟云学术

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Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices

Published:2008-03 Issue: Volume: Page:
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Author:

Nakamura Takashi¹,Baba Mamoru¹,Ibe Eishi²,Yahagi Yasuo²,Kameyama Hideaki³

Affiliation:

1. Tohoku UniversityJapan

2. Hitachi Ltd.Japan

3. Renesas Technology CorporationJapan

Publisher

WORLD SCIENTIFIC

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Evaluating the Broad Neutron Spectrum of Anis;2023

3. Fast neutrons at LNL Legnaro;Journal of Neutron Research;2020-10-19

4. CoolGAL: a Galinstan bathed Be fast neutron production target at the NEPIR facility;EPJ Web of Conferences;2020

5. A Neutron Testing Facility to Study the Radiation Hardness of the Electronic Components at the SC-1000 Synchrocyclotron of National Research Center Kurchatov Institute—Petersburg Nuclear Physics Institute;Physics of Atomic Nuclei;2019-12

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