MICRO WDX-PIXE SYSTEM AND ITS APPLICATION TO CHEMICAL STATE ANALYSIS-Reference-Cited by-同舟云学术

MICRO WDX-PIXE SYSTEM AND ITS APPLICATION TO CHEMICAL STATE ANALYSIS

Published:1999-01 Issue:03n04 Volume:09 Page:103-109
ISSN:0129-0835
Container-title:International Journal of PIXE
language:en
Short-container-title:Int. J. PIXE

Author:

MOKUNO Y.¹,HORINO Y.¹,TERASAWA M.²,SEKIOKA T.²,KINOMURA A.¹,CHAYAHARA A.¹

Affiliation:

1. Osaka National Research Institute, AIST, 1-8-31 Midorigaoka, Ikeda, Osaka 563-8577, Japan

2. Himeji Institute of Technology, 2167 Shosya, Himeji, Hyogo 671-2201, Japan

Abstract

Performance of a micro WDX-PIXE system that consists of position sensitive x-ray spectrometer and the heavy ion microbeam line is described. The influence of the position resolution of the position sensitive proportional counter (PSPC) used in the spectrometer on system energy resolution is discussed based on the measured values for C and O K x-rays. The system has successfully been used for chemical state analysis of various compound materials and small area of the materials (< 3 × 10-3 mm 2) can be analyzed.

Publisher

World Scientific Pub Co Pte Lt

Link

https://www.worldscientific.com/doi/pdf/10.1142/S012908359900019X

Reference10 articles.

1. High energy resolution PIXE with high efficiency using the heavy ion microbeam

2. High energy resolution PIXE analysis using focused MeV heavy ion beams

3. WDX-PIXE analysis of low energy X-rays using a microbeam

4. Focused High-Energy Heavy Ion Beams

5. Changes in the Soft X‐RayLEmission Spectra with Oxidation of the First Series Transition Metals

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1. X-ray Spectrometry;Analytical Chemistry;2002-05-18

2. Chemical state analysis of Cu, Cu2O and CuO with WDX using an ion microbeam;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-07