HEAVY ION-INDUCED COPPER L X-RAY SPECTRA MEASURED WITH A HIGH RESOLUTION X-RAY CRYSTAL SPECTROMETER

Abstract

High resolution L X-ray emission spectra of Cu have been measured for 0.75 MeV/u H , 0.075 and 0.75 MeV/u F , and 0.075 and 0.64 MeV/u Si ion impacts with a Bragg crystal spectrometer. The high resolution X-ray spectra from the Cu thick target for L ι, L η, L α1,2, L β1, and L β3,4 transitions induced by ion excitation are obtained. The X-ray spectra produced by F and Si ion impacts have complicated structures due to multiple L and M shell vacancy production. The L X-ray emission spectra produced by heavy ion impact are compared with the calculated ones based on the Hartree-Fock-Slater method. The origin of the broadening of the L X-ray transition lines to the higher energy side for heavy ion impact is attributed to one 2p plus multiple 3p and 3d electron vacancy production.