First in-beam application of thallium bromide semiconductor detectors to particle-induced X-ray emission

Abstract

For the first time, particle-induced X-ray emission (PIXE) spectra were obtained using TlBr detectors. The TlBr detector was fabricated from a crystal grown with material purified by the zone purification. Its active volume was 1.5 mm × 1.5 mm × 3.1 mm, and it exhibited an energy resolution of a 6.2 keV full-width at half-maximum (FWHM) for 59.5 keV at room temperature. The detector was installed into a PIXE system at Aomori Prefecture Quantum Science Center. A Pb plate target in the PIXE chamber was irradiated with a 20 MeV proton beam, and X-ray peaks for Pb K[Formula: see text] and K[Formula: see text] were successfully detected by the TlBr detector at room temperature.