Affiliation:
1. INRIA, Rocquencourt, B.P. 105, 78153 Le Chesnay CEDEX, France
Abstract
We propose a multifractal approach to the problem of image analysis. We show that an alternative description of images, based on a multifractal characterization, can be used instead of the classical approach that involves smoothing of the discrete data in order to compute local extrema. We classify each point of the image according to two parameters, its type of singularity and its relative height, by computing the spectra associated with different kinds of capacities defined from the gray levels. All this information is then used together through a Bayesian approach.
Publisher
World Scientific Pub Co Pte Lt
Subject
Applied Mathematics,Geometry and Topology,Modelling and Simulation
Cited by
47 articles.
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