Affiliation:
1. School of Mathematics and Statistics, Nanjing University of Information Science and Technology, Nanjing 210044, China
2. Department of Economics, Korea University, Seoul 02841, Republic of Korea
3. Department of Mathematics, Korea University, Seoul 02841, Republic of Korea
Abstract
Magnetic resonance image (MRI) is an important tool to diagnose human diseases effectively. It is very important for research and clinical application to classify the normal and abnormal human brain MRI images automatically. In this paper, an accurate and efficient technique is proposed to extract features of MRIs and classify these images into normal and abnormal categories. We use two-dimensional multifractal detrended fluctuation analysis (2D MF-DFA) to obtain image features. These features are the local generalized Hurst exponents calculated by 2D MF-DFA. In this regard, the values of Hurst exponents are given as the training input vector and are taken to the classifiers. We use [Formula: see text]-nearest neighbor ([Formula: see text]-NN) and support vector machine (SVM) to classify a specific brain MRI as normal or glioma affected. For SVM, we apply the leave-one-out cross-validation method for experimental verification. The 2D MF-DFA-SVM system achieved accuracy, sensitivity, and specificity of [Formula: see text] ±[Formula: see text], [Formula: see text], and [Formula: see text] ±[Formula: see text], respectively. The 2D MF-DFA-[Formula: see text]-NN system achieved accuracy, sensitivity, and specificity of [Formula: see text], [Formula: see text], and [Formula: see text], respectively. We find that when performing binary classification for brain MRIs, the SVM is superior to [Formula: see text]-NN. In addition, our experimental results indicate that the proposed 2D MF-DFA-SVM achieved excellent outcomes compared to those of the previous works. The proposed system is a promising system to clinical use.
Funder
China Scholarship Council
Publisher
World Scientific Pub Co Pte Lt
Subject
Applied Mathematics,Geometry and Topology,Modelling and Simulation
Cited by
16 articles.
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