Evaluating the Performance of Two NaI(Tl) Detectors Using a Combined Approach of Experiment and Monte Carlo Simulation

Abstract

The aim of this study is to compare two identical NaI(Tl) detectors under the same conditions to reduce potential sources of error in future experiments. To this end, an experimental setup using both detectors was designed to measure the gamma spectrum of point sources. In order to verify the experimental results, the same setup was conducted by Monte Carlo simulations. The characteristics of the detectors, such as resolution and efficiency, were analyzed simultaneously to obtain possible differences. The resolution and efficiency of the detectors were found to be slightly different when their settings were the same, but within the expected range. The fitted data gave a standard deviation of 20.749±0.00693 keV for detector 1 and 19.698±0.00647 keV for detector 2 at 662 keV. The experimental data showed that one detector had a resolution of 6.9% and the other 7.2%. The simulation results and experimental data are in good agreement. In conclusion, it was observed that the high errors in the experimental data are due to the 20% uncertainty of the point sources.