Author:
Guo Min,Chandris Panagiotis,Giannini John Paul,Trexler Adam J.,Fischer Robert,Chen Jiji,Vishwasrao Harshad D.,Rey-Suarez Ivan,Wu Yicong,Waterman Clare M.,Patterson George H.,Upadhyaya Arpita,Taraska Justin,Shroff Hari
Abstract
AbstractWe demonstrate a simple method for combining instant structured illumination microscopy (SIM) with total internal reflection fluorescence microscopy (TIRF), doubling the spatial resolution of TIRF (down to 115 +/-13 nm) and enabling imaging frame rates up to 100 Hz over hundreds of time points. We apply instant TIRF-SIM to multiple live samples, achieving rapid, high contrast super-resolution imaging in close proximity to the coverslip surface.
Publisher
Cold Spring Harbor Laboratory
Cited by
1 articles.
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