Applicability of Focused-ion-beam-based Thin Sectioning for STXM-NEXAFS Analysis of Carbon Species: An Examination of Kaolinite-bacteria Composite-Reference-Cited by-同舟云学术

Applicability of Focused-ion-beam-based Thin Sectioning for STXM-NEXAFS Analysis of Carbon Species: An Examination of Kaolinite-bacteria Composite

Published:2023-06-05 Issue:6 Volume:52 Page:508-511
ISSN:0366-7022
Container-title:Chemistry Letters
language:en
Short-container-title:Chem. Lett.

Author:

Shimada Hiroaki¹,Ito Koji¹,Kogure Toshihiro²,Asano Maki³,Yamashita Shohei⁴,Takeichi Yasuo⁵,Takahashi Yoshio²,Wagai Rota¹

Affiliation:

1. National Agriculture and Food Research Organization, Institute for Agro-Environmental Sciences, 3-1-3 Kan-nondai, Tsukuba, Ibaraki 305-8604, Japan

2. Department of Earth and Planetary Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan

3. Faculty of Life and Environmental Sciences, University of Tsukuba, Ibaraki, Japan

4. Institute of Materials Structure Science Photon Factory, High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan

5. Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan

Publisher

Oxford University Press (OUP)

Subject

General Chemistry

Link

http://www.journal.csj.jp/doi/pdf/10.1246/cl.230098

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