Influence of annealing and thickness on the electrical properties of invar36 thin film for strain gauge applications-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Influence of annealing and thickness on the electrical properties of invar36 thin film for strain gauge applications

Published:2013-09-01 Issue:3 Volume:2 Page:155-161
ISSN:2090-9519
Container-title:International Journal of Thin Films Science and Technology
language:
Short-container-title:Int. J. Thin Film Sci. Tec.

Author:

M Kalpana H.,Siddeswara Prasad V.,M Nayak M.

Publisher

Natural Sciences Publishing

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Performance analysis of cerium oxide (CeO₂) doped vanadium oxide (V₂O₅) thin film pressure sensor;2024 International Conference on Smart Systems for applications in Electrical Sciences (ICSSES);2024-05-03

2. Study on influence of thickness and annealing on electrical characteristics of iron-doped vanadium oxide (Fe:V2O5) thin films for sensor application;The European Physical Journal Plus;2024-03-11

3. Effect of thickness and annealing on electrical characteristics of cerium oxide-doped vanadium oxide (CeO2:V2O5) thin film for sensor application;Journal of Materials Science: Materials in Electronics;2024-03

4. Studying the Effects of Annealing and Surface Roughness on Both the Magnetic Property and Surface Energy of Co60Fe20Sm20 Thin Films on Si(100) Substrate;Coatings;2023-10-17

5. Study on green synthesis characterization and electrical properties of cerium oxide (CeO2)-doped vanadium pentoxide (V2O5) nanoparticles for strain gauges;Journal of Materials Science: Materials in Electronics;2022-06-25

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3