X-ray Diffraction Spectroscopy Studies of CuIn2n+1S3n+2 Thin Films-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

X-ray Diffraction Spectroscopy Studies of CuIn2n+1S3n+2 Thin Films

Published:2014-01-01 Issue:1 Volume:3 Page:7-12
ISSN:2090-9519
Container-title:International Journal of Thin Films Science and Technology
language:
Short-container-title:Int. J. Thin Fil. Sci. Tec.

Author:

Khemiri N.,Khalfallah B.,Abdelkader D.,Kanzari M.

Publisher

Natural Sciences Publishing

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Methodical tuning of NH3 gas sensing in WO3 thin films by electron beam irradiation;Journal of Materials Science: Materials in Electronics;2024-02

2. Impact of Ag on the Limit of Detection towards NH3-Sensing in Spray-Coated WO3 Thin-Films;Sensors;2022-03-05

3. Specific Features of Photoluminescence and Nanosecond Relaxation of Photocurrent in CuIn5S8 Crystals upon Strong Optical Excitation;Optics and Spectroscopy;2020-12

4. Exploring the Cu-In-S System under Solvothermal Conditions near the Composition CuIn5 S8;Zeitschrift für anorganische und allgemeine Chemie;2019-01-23

5. Study of structural and morphological properties of thermally evaporated Sn 2 Sb 6 S 11 thin films;Materials Chemistry and Physics;2016-10

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP