Functional data analysis-based yield modeling in year-round crop cultivation

Author:

Matsui Hidetoshi1ORCID,Mochida Keiichi234

Affiliation:

1. Shiga University Faculty of Data Science, , Banba, Hikone, Shiga 522-8522, Japan

2. RIKEN Center for Sustainable Resource Science , Yokohama 230-0045, Japan

3. Yokohama City University Kihara Institute for Biological Research, , Yokohama 244-0813, Japan

4. Nagasaki University School of Information and Data Sciences, , Nagasaki 852-8521 Japan

Abstract

Abstract Crop yield prediction is essential for effective agricultural management. We introduce a methodology for modeling the relationship between environmental parameters and crop yield in longitudinal crop cultivation, exemplified by strawberry and tomato production based on year-round cultivation. Employing functional data analysis (FDA), we developed a model to assess the impact of these factors on crop yield, particularly in the face of environmental fluctuation. Specifically, we demonstrated that a varying-coefficient functional regression model (VCFRM) is utilized to analyze time-series data, enabling to visualize seasonal shifts and the dynamic interplay between environmental conditions such as solar radiation and temperature and crop yield. The interpretability of our FDA-based model yields insights for optimizing growth parameters, thereby augmenting resource efficiency and sustainability. Our results demonstrate the feasibility of VCFRM-based yield modeling, offering strategies for stable, efficient crop production, pivotal in addressing the challenges of climate adaptability in plant factory-based horticulture.

Funder

Development Program for Agriculture, Forestry and Fisheries (funding agency: Bio-oriented Technology Research Advancement Institution

CREST

Japan Science and Technology Agency and KAKENHI

PRESTO

Publisher

Oxford University Press (OUP)

Reference27 articles.

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3. Climate variation explains a third of global crop yield variability;Ray;Nat Commun,2015

4. Crop yield prediction using machine learning: a systematic literature review;Klompenburg;Comput Electron Agric,2020

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