A Unified Test Compression Technique for Scan Stimulus and Unknown Masking Data with No Test Loss
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Published:2008-12-01
Issue:12
Volume:E91-A
Page:3514-3523
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ISSN:0916-8508
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Container-title:IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
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language:en
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Short-container-title:IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Author:
SHI Y.,TOGAWA N.,YANAGISAWA M.,OHTSUKI T.
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Applied Mathematics,Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Signal Processing