Conversion of single-energy CT to parametric maps of dual-energy CT using convolutional neural network

Abstract

Abstract Objectives We propose a deep learning (DL) multitask learning framework using convolutional neural network for a direct conversion of single-energy CT (SECT) to 3 different parametric maps of dual-energy CT (DECT): virtual-monochromatic image (VMI), effective atomic number (EAN), and relative electron density (RED). Methods We propose VMI-Net for conversion of SECT to 70, 120, and 200 keV VMIs. In addition, EAN-Net and RED-Net were also developed to convert SECT to EAN and RED. We trained and validated our model using 67 patients collected between 2019 and 2020. Single-layer CT images with 120 kVp acquired by the DECT (IQon spectral CT; Philips Healthcare, Amsterdam, Netherlands) were used as input, while the VMIs, EAN, and RED acquired by the same device were used as target. The performance of the DL framework was evaluated by absolute difference (AD) and relative difference (RD). Results The VMI-Net converted 120 kVp SECT to the VMIs with AD of 9.02 Hounsfield Unit, and RD of 0.41% compared to the ground truth VMIs. The ADs of the converted EAN and RED were 0.29 and 0.96, respectively, while the RDs were 1.99% and 0.50% for the converted EAN and RED, respectively. Conclusions SECT images were directly converted to the 3 parametric maps of DECT (ie, VMIs, EAN, and RED). By using this model, one can generate the parametric information from SECT images without DECT device. Our model can help investigate the parametric information from SECT retrospectively. Advances in knowledge DL framework enables converting SECT to various high-quality parametric maps of DECT.