MONTE CARLO SIMULATIONS OF OUT-OF-FIELD LET SPECTRA IN WATER PHANTOM IRRADIATED BY SCANNING PENCIL PROTON BEAM

Author:

Štika Jan123,Jelínek Michaelidesová Anna124,Davídková Marie4

Affiliation:

1. Department of Dosimetry and Application of Ionising Radiation , Faculty of Nuclear Sciences and Physical Engineering, , Břehová 7, 110 00 Praha 1, Czech Republic

2. Czech Technical University in Prague , Faculty of Nuclear Sciences and Physical Engineering, , Břehová 7, 110 00 Praha 1, Czech Republic

3. General University Hospital in Prague , U Nemocnice 499/2, 128 08 Praha 2, Czech Republic

4. Department of Radiation Dosimetry, Nuclear Physics Institute of the CAS , Na Truhlářce 39/64, 180 00 Praha 8, Czech Republic

Abstract

Abstract LET spectra can be measured by track-etched detectors. However, these detectors are not able to identify the type of interacting particles. Monte Carlo simulations can provide this missing information. In this work, Monte Carlo simulations based on the EURADOS Work Group 9 experiment consisting of systematic 3D mapping of out-of-field doses and LET spectra in a prototype water phantom were performed. The simulations aimed to identify the types of particles contributing to the out-of-field LET spectra. The total absorbed dose, LET and energy spectra were calculated. The calculated dose distributions and LET spectra were compared with the ones measured by radiophotoluminiscence and track-etched detectors. The out-of-field particles and their LET values were identified. No statistically significant differences between the measured and simulated spectra were revealed in the LET range of 100–2000 keV μm−1.

Funder

European Regional Development Fund-Project ‘Centre for Advanced Applied Sciences’

‘e-Infrastruktura CZ’

Ministry of Education, Youth and Sports of the Czech Republic

ELIXIR-CZ

Publisher

Oxford University Press (OUP)

Subject

Public Health, Environmental and Occupational Health,Radiology, Nuclear Medicine and imaging,General Medicine,Radiation,Radiological and Ultrasound Technology

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