Analysis of Test Generation Complexity for Stuck-At and Path Delay Faults Based on k-Notation
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Published:2007-08-01
Issue:8
Volume:E90-D
Page:1202-1212
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ISSN:0916-8532
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Container-title:IEICE Transactions on Information and Systems
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language:en
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Short-container-title:IEICE Transactions on Information and Systems
Author:
OOI C. Y.,CLOUQUEUR T.,FUJIWARA H.
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Artificial Intelligence,Electrical and Electronic Engineering,Computer Vision and Pattern Recognition,Hardware and Architecture,Software