On Detection of Bridge Defects with Stuck-at Tests
-
Published:2008-03-01
Issue:3
Volume:E91-D
Page:683-689
-
ISSN:0916-8532
-
Container-title:IEICE Transactions on Information and Systems
-
language:en
-
Short-container-title:IEICE Transactions on Information and Systems
Author:
MIYASE K.,TERASHIMA K.,WEN X.,KAJIHARA S.,REDDY S. M.
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Artificial Intelligence,Electrical and Electronic Engineering,Computer Vision and Pattern Recognition,Hardware and Architecture,Software