Detection of CMOS Open Node Defects by Frequency Analysis
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Published:2007-03-01
Issue:3
Volume:E90-D
Page:685-687
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ISSN:0916-8532
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Container-title:IEICE Transactions on Information and Systems
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language:en
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Short-container-title:IEICE Transactions on Information and Systems
Author:
MICHINISHI H.,YOKOHIRA T.,OKAMOTO T.,KOBAYASHI T.,HONDO T.
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Artificial Intelligence,Electrical and Electronic Engineering,Computer Vision and Pattern Recognition,Hardware and Architecture,Software