Probing Single In-Donor Emitter Sites in ZnO: Ion-Beam Processing to Overcome Diffraction-Limited Optical Measurements-Reference-Cited by-同舟云学术

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Probing Single In-Donor Emitter Sites in ZnO: Ion-Beam Processing to Overcome Diffraction-Limited Optical Measurements

Published:2023-07-22 Issue:Supplement_1 Volume:29 Page:1823-1824
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Matthews Bethany E¹,Zimmermann Christian²,Hansen Ethan¹,Niaouris Vasileios¹,Fu Kai-Mei²³,Spurgeon Steven R¹²

Affiliation:

1. Energy and Environment Directorate, Pacific Northwest National Laboratory , Richland, WA , United States

2. Department of Physics, University of Washington , Seattle, WA , United States

3. Department of Electrical and Computer Engineering, University of Washington , Seattle, WA , United States

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/29/Supplement_1/1823/50934963/ozad067.943.pdf

Reference3 articles.

1. Zinc Oxide—From Synthesis to Application: A Review

2. Coherence Properties of Shallow Donor Qubits in ZnO

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