Exploring the Effect of Diffraction Conditions on Off-Axis Phonon EELS-Reference-Cited by-同舟云学术

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Exploring the Effect of Diffraction Conditions on Off-Axis Phonon EELS

Published:2023-07-22 Issue:Supplement_1 Volume:29 Page:653-655
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Wang Yifan¹,Yang Shize²,Fischer Alec³,Grotjohn Timothy⁴⁵,Ponce Fernando³,Crozier Peter A¹

Affiliation:

1. School for Engineering of Matter, Transport & Energy, Arizona State University , Tempe, AZ , United States

2. Eyring Materials Center, Arizona State University , Tempe, AZ , United States

3. Department of Physics, Arizona State University , Tempe, AZ , United States

4. Department of Electrical & Computer Engineering, Michigan State University , East Lansing, MI , United States

5. Fraunhofer USA Center Midwest, Michigan State University , East Lansing, MI , United States

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/29/Supplement_1/653/50933130/ozad067.320.pdf

Reference10 articles.

1. Vibrational spectroscopy at atomic resolution with electron impact scattering

2. Single-defect phonons imaged by electron microscopy

3. Emergent interface vibrational structure of oxide superlattices

4. Nanoscale momentum-resolved vibrational spectroscopy

5. Position and momentum mapping of vibrations in graphene nanostructures

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