Wide Field of View Versus High Spatial Resolution and High Sensitivity – the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals-Reference-Cited by-同舟云学术

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Wide Field of View Versus High Spatial Resolution and High Sensitivity – the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals

Published:2023-07-22 Issue:Supplement_1 Volume:29 Page:790-791
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Ulfig Robert¹,Reddy Steven²,Saxey David²,Rickard Will²,Fougerouse Denis²,Pearce Mark³,Fisher Louise³,Kilburn Matt⁴,Gagliardo Paul⁴,Clifton Peter H¹,Reinhard David A¹,Larson David J¹

Affiliation:

1. CAMECA Instruments Inc. , Madison, WI , United States

2. Geoscience Atom Probe Facility, John de Laeter Centre, School of Earth and Planetary Sciences, Curtin University , Perth , Australia

3. CSIRO , Kensington, Perth , Australia

4. Centre for Microscopy, Characterization and Analysis, University of Western Australia , Perth , Australia

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/29/Supplement_1/790/50933946/ozad067.393.pdf

Reference3 articles.

1. Xenotime at the Nanoscale: U‐Pb Geochronology and Optimisation of Analyses by Atom Probe Tomography

2. Time Differences in the Formation of Meteorites as Determined from the Ratio of Lead-207 to Lead-206

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