A Comprehensive Examination of Aluminum Oxide (Al2O3) Using Extreme and Near Ultraviolet Laser-Assisted Atom Probe Tomography
Author:
Affiliation:
1. National Institute of Standards and Technology , Boulder, CO , United States
Publisher
Oxford University Press (OUP)
Subject
Instrumentation
Link
https://academic.oup.com/mam/article-pdf/29/Supplement_1/83/50931880/ozad067.033.pdf
Reference6 articles.
1. Characterization of a dielectric/GaN system using atom probe tomography
2. Al2O3 Grain Boundary Segregation in a Thermal Barrier Coating on a Ni-Based Superalloy
3. Analysis of Bulk Dielectrics with Atom Probe Tomography
4. A Three-Dimensional Atom Probe Microscope Incorporating a Wavelength-Tuneable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light Source
5. Extreme Ultraviolet Radiation Pulsed Atom Probe Tomography of III-Nitride Semiconductor Materials
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