Simultaneous HAADF & EELS Data Acquisition for Relative Quantification of Temperature and Thickness Effects on Thermal Diffuse Scattering in STEM-Reference-Cited by-同舟云学术

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Simultaneous HAADF & EELS Data Acquisition for Relative Quantification of Temperature and Thickness Effects on Thermal Diffuse Scattering in STEM

Published:2023-07-22 Issue:Supplement_1 Volume:29 Page:358-360
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Minson Paul S¹²,Rivera Felipe¹²,Vanfleet Richard²

Affiliation:

1. Brigham Young University , Electron Microscopy Facility, Provo, UT , United States

2. Brigham Young University , Physics and Astronomy, Provo, UT , United States

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/29/Supplement_1/358/50931944/ozad067.167.pdf

Reference4 articles.

1. Experimental quantification of annular dark-field images in scanning transmission electron microscopy

2. Quantitative STEM: A method for measuring temperature and thickness effects on thermal diffuse scattering using STEM/EELS, and for testing electron scattering models

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