The Impact of Artificial Intelligence on <i>In Situ</i> Electron Microscopy-Reference-Cited by-同舟云学术

The Impact of Artificial Intelligence on In Situ Electron Microscopy

Published:2023-07-22 Issue:Supplement_1 Volume:29 Page:1595-1596
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Crozier Peter A¹,Morales Adrià Marcos²,Leibovich Matan²,Mohan Sreyas²,Haluai Piyush¹,Tan Mai¹,Vincent Joshua¹,Gilankar Advait¹,Wang Yifan¹,Fernandez-Granda Carlos²

Affiliation:

1. School for Engineering of Matter, Transport and Energy, Arizona State University , Tempe, AZ , USA

2. Courant Institute of Mathematical Sciences, New York University , New York, NY , USA

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/29/Supplement_1/1595/50931368/ozad067.1105.pdf

Reference9 articles.

1. Atmospheric Pressure Scanning Transmission Electron Microscopy

2. An Ex-SituReactor with Anaerobic Specimen Transfer Capabilities for TEM Studies of Reactive (Catalyst) Specimens

3. A new MEMS-based system for ultra-high-resolution imaging at elevated temperatures

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