Optimizing Protection for Specimen Preparation on Complex 3D Nanostructures-Reference-Cited by-同舟云学术

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Optimizing Protection for Specimen Preparation on Complex 3D Nanostructures

Published:2023-07-22 Issue:Supplement_1 Volume:29 Page:503-504
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Mosberg Aleksander B¹,Sankaran Abinaya²,Ryan Kevin M²,van Helvoort Antonius T J³,Ramasse Quentin¹

Affiliation:

1. SuperSTEM Laboratory, SciTech Daresbury Campus , Daresbury , United Kingdom

2. Materials and Surface Science Institute, University of Limerick , Limerick , Ireland

3. Department of Physics, Norwegian University of Science and Technology , Trondheim , Norway

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/29/Supplement_1/503/50931800/ozad067.239.pdf

Reference5 articles.

1. Sample preparation for atomic-resolution STEM at low voltages by FIB

2. In situ lift-out: Steps to improve yield and a comparison with other FIB TEM sample preparation techniques

3. FIB Plan and Side View Cross-Sectional TEM Sample Preparation of Nanostructures

4. Wet-chemical etching of FIB lift-out TEM lamellae for damage-free analysis of 3-D nanostructures

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