5D-TOF-STIM Imaging with a Low-energy He+ Focused Ion Beam
Author:
Affiliation:
1. Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST) , Belvaux , Luxembourg
Publisher
Oxford University Press (OUP)
Subject
Instrumentation
Link
https://academic.oup.com/mam/article-pdf/29/Supplement_1/530/50932518/ozad067.249.pdf
Reference5 articles.
1. Electron Energy-Loss Spectroscopy of Multipolar Edge and Cavity Modes in Silver Nanosquares
2. Simultaneous assessment of energy, charge state and angular distribution for medium energy ions interacting with ultra-thin self-supporting targets: A time-of-flight approach
3. Examination of ion-induced Auger electron spectra of Ti, Cr and Co in a mass-selecting Focused Ion Beam with a gold–silicon liquid metal source
4. Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector
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