Semi-Automated EXLO for Ambient and Cryogenic TEM Specimen Manipulation-Reference-Cited by-同舟云学术

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Semi-Automated EXLO for Ambient and Cryogenic TEM Specimen Manipulation

Published:2023-07-22 Issue:Supplement_1 Volume:29 Page:553-553
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Darwish Ahmed A¹,Dougherty Thomas E¹,Heck Brandon J¹,Colletta Michael²,Yu Yue²,Kourkoutis Lena F²³,Beggs Kyle⁴,Kassab Alain J⁴,Dohnalkova Alice⁵,Giannuzzi Lucille A¹

Affiliation:

1. EXpressLO LLC , Lehigh Acres, FL , United States

2. Applied and Engineering Physics, Cornell University , Ithaca, NY , United States

3. Kavli Institute at Cornell for Nanoscale Science, Cornell University , Ithaca, NY United States

4. Centecorp LLC, Longwood , FL , United States

5. Pacific Northwest National Laboratory , Richland, WA , United States

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/29/Supplement_1/553/50932610/ozad067.262.pdf

Reference4 articles.

1. Theory and New Applications ofEx SituLift Out

2. Cryo-EXLO Manipulation of FIB Specimens for Cryo-TEM

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