Beyond Atom Mapping in Atom Probe Tomography Using Field Evaporation Energy Loss Spectroscopy-Reference-Cited by-同舟云学术

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Beyond Atom Mapping in Atom Probe Tomography Using Field Evaporation Energy Loss Spectroscopy

Published:2023-07-22 Issue:Supplement_1 Volume:29 Page:605-606
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Vurpillot François¹,Rousseau Loïc¹²,Hatzoglou Constantinos¹,Normand Antoine¹,Gault Baptiste³⁴,Cerezo Alfred⁵

Affiliation:

1. Groupe Physique des Matériaux, Université de Rouen , Normandie , France

2. ESIGELEC, Saint Etienne du Rouvray , Normandie , France

3. Max-Planck Institut für Eisenforschung GmbH, D-40237 Düsseldorf , Germany

4. Department of Materials, Royal School of Mines, Imperial College , London, England

5. Materials Department, University of Oxford , UK

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/29/Supplement_1/605/50932910/ozad067.293.pdf

Reference6 articles.

1. Atomically resolved tomography to directly inform simulations for structure–property relationships

2. Atom probe informed simulations of dislocation–precipitate interactions reveal the importance of local interface curvature

3. Atom Probe Field Ion Microscopy

4. Interpretation of atom probe tomography data for the intermetallic TiAl+Nb by means of field evaporation simulation

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