Subsampling Methods for Fast Electron Backscattered Diffraction Analysis for SEM-Reference-Cited by-同舟云学术

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Subsampling Methods for Fast Electron Backscattered Diffraction Analysis for SEM

Published:2023-07-22 Issue:Supplement_1 Volume:29 Page:467-469
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Broad Zoë¹,Nicholls Daniel¹,Wells Jack²,Moshtaghpour Amirafshar¹³,Robinson Alex W¹,Masters Robert⁴,Hughes Louise⁴,Browning Nigel D¹

Affiliation:

1. Department of Mechanical, Materials and Aerospace Engineering, University of Liverpool , UK

2. Distributed Algorithms Centre for Doctoral Training, University of Liverpool , Liverpool , UK

3. Correlated Imaging Group, Rosalind Franklin Institute, Harwell Science and Innovation Campus , Didcot , UK

4. Oxford Instruments Nanoanalysis , High Wycombe , UK

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/29/Supplement_1/467/50931948/ozad067.220.pdf

Reference7 articles.

1. The Benefits and Applications of a CMOS-based EBSD Detector

2. Correction of artefacts associated with large area EBSD

3. Robust uncertainty principles: exact signal reconstruction from highly incomplete frequency information

4. Compressed sensing

5. The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy

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1. The Potential of Subsampling and Inpainting for Fast Low-Dose Cryo FIB-SEM Imaging;Microscopy and Microanalysis;2024-02

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