U-Net Implementation for High Throughput Grain Boundary Detection in Bright Field TEM Micrographs: Toward <i>In Situ</i> Grain Growth Studies-Reference-Cited by-同舟云学术

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U-Net Implementation for High Throughput Grain Boundary Detection in Bright Field TEM Micrographs: Toward In Situ Grain Growth Studies

Published:2023-07-22 Issue:Supplement_1 Volume:29 Page:1581-1582
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Patrick Matthew J¹,Eckstein James K²,Lopez Javier³,Ma Alan J⁴,Toderas Silvia¹,Levine Stacey⁵,Barmak Katayun¹

Affiliation:

1. Department of Applied Physics and Applied Mathematics, Columbia University , New York, NY , USA

2. Department of Physics, University of Illinois -- Urbana-Champaign , Champaign, IL , USA

3. Department of Mechanical Engineering, Columbia University , New York, NY , USA

4. Department of Mathematics, Columbia University , New York, NY , USA

5. Department of Mathematics and Computer Science, Duquesne University , Pittsburgh, PA , USA

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/29/Supplement_1/1581/50934975/ozad067.813.pdf

Reference4 articles.

1. A methodology for automated quantitative microstructural analysis of transmission electron micrographs

2. Grain growth and the puzzle of its stagnation in thin films: The curious tale of a tail and an ear

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Advances in Experimental Studies of Grain Growth in Thin Films;JOM;2024-03-18

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