Structural Analysis Enabled by the Invizo 6000® Large Field-of-View Atom Probe
Author:
Affiliation:
1. CAMECA Instruments Inc. , Madison, WI , United States
2. National Electron Microscope Facility, Department of Metallurgical Engineering, IIT (BHU) , Varanasi , India
Publisher
Oxford University Press (OUP)
Subject
Instrumentation
Link
https://academic.oup.com/mam/article-pdf/29/Supplement_1/813/50934549/ozad067.404.pdf
Reference7 articles.
1. The Atom‐Probe Field Ion Microscope
2. The 10 cm Atom Probe
3. Application of a position‐sensitive detector to atom probe microanalysis
4. Toward a scanning atom probe — computer simulation of electric field -
5. First Data from a Commercial Local Electrode Atom Probe (LEAP)
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