Novel Focused Ion Beam Liftouts for Spatial Characterization of Spherical Biominerals With Transmission Electron Microscopy

Author:

Zambare Neerja1ORCID,Arey Bruce2,Qafoku Odeta1,Koirala Krishna Prasad3ORCID,Kovarik Libor3,Dohnalkova Alice1

Affiliation:

1. Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory , 902 Battelle Blvd, Richland, WA 99354 , USA

2. National Security Directorate, Pacific Northwest National Laboratory , 902 Battelle Blvd, Richland, WA 99354 , USA

3. Physical and Computational Sciences Directorate, Pacific Northwest National Laboratory , 902 Battelle Blvd, Richland, WA 99354 , USA

Abstract

Abstract Focused ion beam (FIB) is frequently used to prepare electron- and X-ray-beam-transparent thin sections of samples, called lamellae. Typically, lamellae are prepared from only a subregion of a sample. In this paper, we present a novel approach for FIB lamella preparation of microscopic samples, wherein the entire cross-section of the whole sample can be investigated. The approach was demonstrated using spherical, porous, and often hollow microprecipitates of biologically precipitated calcium carbonate. The microprecipitate morphology made these biogenic samples more fragile and challenging than materials commonly investigated using FIB lamellae. Our method enables the appropriate orientation of the lamellae required for further electron/X-ray analyses after attachment to the transmission electron microscopy (TEM) grid post and facilitates more secure adhesion onto the grid post. We present evidence of autofluorescence in bacterially precipitated vaterite using this lamella preparation method coupled with TEM selected area diffraction. This innovative approach allows studying biomineralization at the micro to nano scales, which can provide novel insights into bacterial responses to microenvironmental conditions.

Funder

Laboratory Directed Research and Development

Pacific Northwest National Laboratory

Battelle Memorial Institute

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

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