A novel approach to detect line emission under high background in high-resolution X-ray spectra

Abstract

ABSTRACTWe develop a novel statistical approach to identify emission features or set upper limits in high-resolution spectra in the presence of high background. The method relies on detecting differences from the background using smooth tests and using classical likelihood ratio tests to characterize known shapes like emission lines. We perform signal detection or place upper limits on line fluxes while accounting for the problem of multiple comparisons. We illustrate the method by applying it to a Chandra LETGS + HRC-S observation of symbiotic star RT Cru, successfully detecting previously known features like the Fe line emission in the 6–7 keV range and the Iridium-edge due to the mirror coating on Chandra. We search for thermal emission lines from Ne x, Fe xvii, O viii, and O vii, but do not detect them, and place upper limits on their intensities consistent with a ≈1 keV plasma. We serendipitously detect a line at 16.93 Å (0.732 keV) that we attribute to photoionization or a reflection component.