Control of island formation on silicon surfaces using ultra-high-vacuum scanning electron microscopy-Reference-Cited by-同舟云学术

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Control of island formation on silicon surfaces using ultra-high-vacuum scanning electron microscopy

Published:2000-01-01 Issue:2 Volume:49 Page:225-229
ISSN:0022-0744
Container-title:Journal of Electron Microscopy
language:en
Short-container-title:Journal of Electron Microscopy

Author:

Homma Y.,Finnie P.,Ogino T.

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

http://academic.oup.com/jmicro/article-pdf/49/2/225/2664106/49-2-225.pdf

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Functionalisation through periodically arranged nanostructures;International Journal of Nanotechnology;2012

2. Selective functionalization of substrates through assembled nanostructures: From physics to biology;Applied Surface Science;2009-10

3. Metal-rich Au-silicide nanoparticles for use in nanotechnology;Applied Physics Letters;2009-06-08

4. Wetting of Si surfaces by Au–Si liquid alloys;Journal of Applied Physics;2003-04

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