Electron atomic scattering factors, Debye–Waller factors and the optical potential for high-energy electron diffraction
Author:
Publisher
Oxford University Press (OUP)
Subject
Radiology Nuclear Medicine and imaging,Instrumentation,Structural Biology
Link
http://academic.oup.com/jmicro/article-pdf/54/3/199/2573368/dfi045.pdf
Reference53 articles.
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3. Osakabe N, Tanishiro Y, Yagi K, and Honjo G (1980) Reflection electron microscopy of clean and gold deposited (111) silicon surfaces. Surf. Sci.97: 393–408.
4. Osakabe N, Tanishiro Y, Yagi K, and Honjo G (1981) Image contrast of dislocations and atomic steps on (111) silicon surface in reflection electron microscopy. Surf. Sci.102: 424–442.
5. Hsu T and Cowley J (1983) Reflection electron microscopy (rem) of f.c.c. metals. Ultramicroscopy11: 167–172.
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