A novel approach to scanning electron microscopy at ambient atmospheric pressure
Author:
Affiliation:
1. Hitachi High-Technologies Corporation, Hitachinaka, Ibaraki 312-8504, Japan
2. Niigata University Graduate School of Medical and Dental Sciences, Niigata city 951-9510, Japan
Publisher
Oxford University Press (OUP)
Subject
Radiology, Nuclear Medicine and imaging,Instrumentation,Structural Biology
Link
http://academic.oup.com/jmicro/article-pdf/64/2/97/26556735/dfu107.pdf
Reference12 articles.
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2. Design and operation of a differentially pumped environmental chamber for the HVEM;Turner;Ultramicroscopy.,1981
3. Foundations of environmental scanning electron microscopy;Danilatos;Adv. Electron. El. Phys.,1988
4. Development of natural SEM and some applications;Yamada;Acta Microsc.,1993
5. Low-voltage backscattered electron imaging of non-coated biological samples in a low-vacuum environment using a variable-pressure scanning electron microscope with a YAG-detector;Ushiki;J. Electron. Microsc.,1998
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