Image blurring of thick specimens due to MeV transmission electron scattering: a Monte Carlo study-Reference-Cited by-同舟云学术

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Image blurring of thick specimens due to MeV transmission electron scattering: a Monte Carlo study

Published:2011-07-19 Issue:5 Volume:60 Page:315-320
ISSN:2050-5698
Container-title:Microscopy
language:en
Short-container-title:Microscopy

Author:

Wang F.,Zhang H.-B.,Cao M.,Nishi R.,Takaoka A.

Publisher

Oxford University Press (OUP)

Subject

Radiology Nuclear Medicine and imaging,Instrumentation,Structural Biology

Link

http://academic.oup.com/jmicro/article-pdf/60/5/315/5855266/dfr054.pdf

Reference22 articles.

1. Nanometer-resolution electron microscopy through micrometers-thick water layers

2. A Method for Observing Silver-Stained Osteocytes In Situ in 3-μm Sections Using Ultra-High Voltage Electron Microscopy Tomography

3. Electron Tomography on Micrometer-Thick Specimens with Nanometer Resolution

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1. Non-classical crystallization of CeO₂ by means of in situ electron microscopy;Nanoscale;2023

2. Transient Characteristics of Charging Effects due to E-Beam Irradiation: A Method of SEY-Based Charging Balance Mode;IEEE Transactions on Plasma Science;2019-08

3. Empirical determination of transmission attenuation curves in mass–thickness contrast TEM imaging;Ultramicroscopy;2019-05

4. Automatic system for electron tomography data collection in the ultra-high voltage electron microscope;Micron;2017-12

5. The influence of structure depth on image blurring of micrometres-thick specimens in MeV transmission electron imaging;Micron;2016-04

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