Generalized single-particle cryo-EM – a historical perspective-Reference-Cited by-同舟云学术

Generalized single-particle cryo-EM – a historical perspective

Published:2015-11-12 Issue:1 Volume:65 Page:3-8
ISSN:2050-5698
Container-title:Microscopy
language:en
Short-container-title:Microscopy (Tokyo)

Author:

Frank Joachim

Funder

HHMI

NIH

Publisher

Oxford University Press (OUP)

Subject

Radiology, Nuclear Medicine and imaging,Instrumentation,Structural Biology

Link

http://academic.oup.com/jmicro/article-pdf/65/1/3/7952504/dfv358.pdf

Reference83 articles.

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2. Electron counting and beam-induced motion correction enable near-atomic-resolution single-particle cryo-EM

3. Reconstruction of Three Dimensional Structures from Electron Micrographs

4. The Fourier transform of an electron micrograph: effects of defocussing and aberrations, and implications for the use of underfocus contrast enhancement;Erickson;Ber. Bunsenges. Phys. Chem.,1970

5. Molecular structure determination by electron microscopy of unstained crystalline specimens

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