In-situstraining and time-resolved electron tomography data acquisition in a transmission electron microscope-Reference-Cited by-同舟云学术

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In-situstraining and time-resolved electron tomography data acquisition in a transmission electron microscope

Published:2016-12-18 Issue: Volume: Page:
ISSN:2050-5698
Container-title:Microscopy
language:en
Short-container-title:Microscopy (Tokyo)

Author:

Hata S.,Miyazaki S.,Gondo T.,Kawamoto K.,Horii N.,Sato K.,Furukawa H.,Kudo H.,Miyazaki H.,Murayama M.

Funder

Japan Science Technology Agency (JST)

Publisher

Oxford University Press (OUP)

Subject

Radiology, Nuclear Medicine and imaging,Instrumentation,Structural Biology

Link

http://academic.oup.com/jmicro/article-pdf/66/2/143/14100550/dfw109.pdf

Reference22 articles.

1. Three-dimensional STEM for observing nanostructures

2. Three-dimensional reconstruction of buried nanoparticles by element-sensitive tomography based on inelastically scattered electrons;Möbus;Appl. Phys. Lett.,2001

3. Four-Dimensional Spectral Tomography of Carbonaceous Nanocomposites

4. Three-dimensional analysis of dislocation networks in GaN using weak-beam dark-field electron tomography

5. Transition from a punched-out dislocation to a slip dislocation revealed by electron tomography;Tanaka;J. Mater. Res.,2010

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