Local lattice parameter determination of a silicon (001) layer grown on a sapphire (1102) substrate using convergent-beam electron diffraction
Author:
Publisher
Oxford University Press (OUP)
Subject
Instrumentation
Link
http://academic.oup.com/jmicro/article-pdf/55/3/129/2665173/dfl020.pdf
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Spectroscopic investigations of arrays containing vertically and horizontally aligned silicon nanowires;Materials Research Express;2016-12-08
2. Bloch wave simulations in the frozen lattice approximation;Ultramicroscopy;2013-12
3. Improvement of the precision of lattice parameter determination by nano-beam electron diffraction;Microscopy;2013-04-18
4. Automated characterization of bending and expansion of a lattice of a Si substrate near a SiGe/Si interface by using split HOLZ line patterns;Journal of Electron Microscopy;2010-05-19
5. Lattice distortions in GaN on sapphire using the CBED–HOLZ technique;Ultramicroscopy;2009-09
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