Estimation of wave fields of incident beams in a transmission electron microscope by using a small selected-area aperture
Author:
Publisher
Oxford University Press (OUP)
Subject
Instrumentation
Link
http://academic.oup.com/jmicro/article-pdf/60/2/101/5853143/dfr002.pdf
Reference11 articles.
1. Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope
2. TEM Characterization of W-O-N Coatings
3. Electron holographic material analysis at atomic dimensions
4. A new symmetrized solution for phase retrieval using the transport of intensity equation
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