Automated acquisition of vast numbers of electron holograms with atomic-scale phase information

Author:

Takahashi Yoshio1,Akashi Tetsuya1,Sato Atsuko2,Tanigaki Toshiaki1,Shinada Hiroyuki1,Murakami Yasukazu2

Affiliation:

1. Research & Development Group, Hitachi, Ltd, Hatoyama Saitama 350-0395, Japan

2. Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka 819-0395, Japan

Abstract

Abstract An automated acquisition system for collecting a large number of electron holograms, to improve the statistical precision of phase analysis, was developed. A technique for shifting the electron beam in combination with stage movement allows data to be acquired over a wide area of a TEM-specimen grid. Undesired drift in the hologram position, which may occur during the hologram acquisition, can be corrected in real time by automated detection of the interference-fringe region in an image. To demonstrate the usefulness of the developed automated hologram acquisition system, gold nanoparticles dispersed on a carbon foil were observed with a 1.2-MV atomic resolution holography electron microscope. The system could obtain 1024 holograms, which provided phase maps for more than 500 nanoparticles with a lateral resolution of 0.14 nm, in just 1 h. The observation results revealed an anomalous increase in mean inner potential for a particle size smaller than 4 nm. The developed automated hologram acquisition system can be applied to improve the precision of phase measurement by averaging many phase images, as demonstrated by single particle analysis for biological entities. Moreover, the system makes it possible to study electrostatic potential of catalysts and other functional nanoparticles at atomic resolution.

Funder

Japan Science and Technology Corporation

Core Research for Evolutional Science and Technology

Publisher

Oxford University Press (OUP)

Subject

Radiology Nuclear Medicine and imaging,Instrumentation,Structural Biology

Reference30 articles.

1. A high resolution electron interference microscope and its application to the measurement of mean inner potential;Yada;J. Electr. Microsc.,1973

2. Accurate measurements of mean inner potential of crystal wedges using digital electron holograms;Gajdardziska-Josifovska;Ultramicroscopy,1993

3. The effect of dynamical scattering in off-axis holographic mean inner potential and inelastic mean free path measurements;Lubk;Ultramicroscopy,2010

4. Two-dimensional mapping of the electrostatic potential in transistors by electron holography;Rau;Phys. Rev. Lett.,1999

5. Semiconductor dopant profiling by off-axis electron holography;Li;Ultramicroscopy,2003

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