Effects of non-rotationally symmetric aberrations on the quantitative measurement of lattice positions in a graphene monolayer using high-resolution transmission electron microscopy-Reference-Cited by-同舟云学术

Effects of non-rotationally symmetric aberrations on the quantitative measurement of lattice positions in a graphene monolayer using high-resolution transmission electron microscopy

Published:2015-06-12 Issue:5 Volume:64 Page:311-318
ISSN:2050-5698
Container-title:Microscopy
language:en
Short-container-title:Microscopy (Tokyo)

Author:

Lin Fang,Jian Jiajun,Ye Lvshan,Jin Chuanhong

Funder

National Science Foundation of China

National Basic Research Program of China

Zhejiang University

Visiting Scholars Fund of State Key Laboratory of Silicon Materials

Guangdong Natural Science Foundation

National College Students’

Publisher

Oxford University Press (OUP)

Subject

Radiology, Nuclear Medicine and imaging,Instrumentation,Structural Biology

Link

http://academic.oup.com/jmicro/article-pdf/64/5/311/5855881/dfv025.pdf

Reference25 articles.

1. Electric Field Effect in Atomically Thin Carbon Films

2. Fabrication of a Freestanding Boron Nitride Single Layer and Its Defect Assignments

3. Growth of Large-Area 2D MoS2(1-x)Se2xSemiconductor Alloys

4. Identification of active atomic defects in a monolayered tungsten disulphide nanoribbon

5. Two-Dimensional Vanadium-Doped ZnO Nanosheet-Based Flexible Direct Current Nanogenerator

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