Integrating High-Performance Computing with Electron Microscopy for Scientific Insights-Reference-Cited by-同舟云学术

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Integrating High-Performance Computing with Electron Microscopy for Scientific Insights

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Ghosh Ayana¹,Roccapriore Kevin²,Boebinger Matthew G²,Mukherjee Debangshu¹,Al-Najjar Anees¹,Mcdonnell Marshall³,Kalinin Sergei V⁴,Ziatdinov Maxim⁵

Affiliation:

1. Computational Science and Engineering Division, Oak Ridge National Laboratory , Oak Ridge, TN , USA

2. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , Oak Ridge, TN , USA

3. Computer Science and Mathematics Division, Oak Ridge National Laboratory , Oak Ridge, TN , USA

4. Department of Materials Science and Engineering, University of Tennessee , Knoxville, TN , USA

5. Physical Sciences Division, Pacific Northwest National Lab , Richland, WA , USA

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.162/58670503/ozae044.162.pdf

Reference14 articles.

1. The impact of STEM aberration correction on materials science

2. Seeing the atoms more clearly: STEM imaging from the Crewe era to today

3. How the doors to the nanoworld were opened

4. Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods

5. Scanning probe microscopy of oxide surfaces: atomic structure and properties

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