Development of Electron-Beam Induced Soft X-ray and Vacuum Ultraviolet Emission Spectrometer-Reference-Cited by-同舟云学术

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Development of Electron-Beam Induced Soft X-ray and Vacuum Ultraviolet Emission Spectrometer

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Koshiya Shogo¹,Murano Takanori¹,McSwiggen Peter²,Robertson Vern²

Affiliation:

1. JEOL Ltd. , SA Business Unit, Akishima, Tokyo , Japan

2. JEOL USA Inc. , Peabody, MA , United States

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.098/58671874/ozae044.098.pdf

Reference5 articles.

1. Development of a sub-eV resolution soft-X-ray spectrometer for a transmission electron microscope

2. Development of soft X-ray emission spectrometer for EPMA/SEM and its application

3. Laminar-type gratings overcoated with carbon-based materials to enhance analytical sensitivity of flat-field emission spectrograph in the VUV region

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