Damage Diffusion Model in Scanning Transmission Electron Microscopy-Reference-Cited by-同舟云学术

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Damage Diffusion Model in Scanning Transmission Electron Microscopy

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Moshtaghpour Amirafshar¹²,Velazco-Torrejon Abner¹,Robinson Alex W²³,Nicholls Daniel²³,Browning Nigel D²³,Kirkland Angus I¹⁴

Affiliation:

1. Correlated Imaging, Rosalind Franklin Institute , Harwell Science & Innovation Campus, Didcot , UK

2. Mechanical, Materials, & Aerospace Engineering, University of Liverpool , Liverpool , UK

3. SenseAI Innovations Ltd., Brodie Tower, University of Liverpool , Liverpool , UK

4. Department of Materials, University of Oxford , Oxford , UK

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.988/58670049/ozae044.988.pdf

Reference10 articles.

1. Primary radiation damage: A review of current understanding and models

2. Radiation damage in the TEM and SEM

3. Cryo-electron ptychography: Applications and potential in biological characterisation

4. Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process

5. Minimising damage in high resolution scanning transmission electron microscope images of nanoscale structures and processes

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