Understanding Formation of Irradiation-Induced Defects through 4D-STEM, Electron Tomography, and WBDF-STEM-Reference-Cited by-同舟云学术

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Understanding Formation of Irradiation-Induced Defects through 4D-STEM, Electron Tomography, and WBDF-STEM

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Lin Yan-Ru¹,Zhao Yajie²,Zachman Michael J²,Arregui-Mena Jose' D¹,Grace Burke M³,Zinkle Steven J¹⁴

Affiliation:

1. Materials Science and Technology Division, Oak Ridge National Laboratory , Oak Ridge, TN , United States

2. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , Oak Ridge, TN , United States

3. Idaho National Laboratory , Idaho Falls, ID , United States

4. Department of Nuclear Engineering, University of Tennessee , Knoxville, TN , United States

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.122/58671596/ozae044.122.pdf

Reference10 articles.

1. Materials challenges in nuclear energy

2. Advances and Applications of Atomic-Resolution Scanning Transmission Electron Microscopy

3. Application of STEM characterization for investigating radiation effects in BCC Fe-based alloys

4. Atomic configuration of irradiation-induced planar defects in 3C-SiC

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