Combining Cathodoluminescence Hyperspectral Imaging with Other Electron Microscopy Modes to Study Semiconducting Materials for Ultraviolet Applications-Reference-Cited by-同舟云学术

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Combining Cathodoluminescence Hyperspectral Imaging with Other Electron Microscopy Modes to Study Semiconducting Materials for Ultraviolet Applications

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Edwards Paul R¹,Cameron Douglas¹²,Hunter Daniel A¹³,Naresh-Kumar G¹⁴,Martin Robert W¹

Affiliation:

1. Department of Physics, SUPA, University of Strathclyde , Glasgow, Scotland , United Kingdom

2. Gatan Inc. , Pleasanton, CA , United States

3. Infinitesima Ltd , Abingdon, England , United Kingdom

4. School of Physics and Astronomy, Cardiff University , Cardiff, Wales , United Kingdom

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.003/58671181/ozae044.003.pdf

Reference6 articles.

1. The emergence and prospects of deep-ultraviolet light-emitting diode technologies

2. Simultaneous composition mapping and hyperspectral cathodoluminescence imaging of InGaN epilayers

3. Core–Shell Nanorods as Ultraviolet Light-Emitting Diodes

4. The influence of threading dislocations propagating through an AlGaN UVC LED

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