The “Platform 9¾ Problem” in Fluctuation Electron Microscopy-Reference-Cited by-同舟云学术

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The “Platform 9¾ Problem” in Fluctuation Electron Microscopy

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Zjajo A¹,Du H²,Dunin-Borkowski R E²,Rezikyan A³,Gibson J M⁴,Treacy M M J¹

Affiliation:

1. Department of Physics, Arizona State University , Tempe, AZ , USA

2. Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons , Jülich , Germany

3. Characterization Science Department, Corning Inc. , Corning, NY , USA

4. FAMU-FSU College of Engineering , Tallahassee, FL , USA

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.937/58670332/ozae044.937.pdf

Reference4 articles.

1. High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy

2. Speckle Suppression by Decoherence in Fluctuation Electron Microscopy

3. Reducing Decoherence in Fluctuation Electron Microscopy

4. Treating Knock-On Displacements in Fluctuation Electron Microscopy Experiments

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