V2O3 Thin Film Insulator-Metal Transition Characterization Using Cryogenic 4D-STEM

Author:

Pofelski Alexandre1,Kalcheim Yoav2,Salev Pavel3,Rivera Alberto4,Huang Chubin2,Schuller Ivan K5,Del Valle Javier6,Zhu Yimei1

Affiliation:

1. Condensed Matter Physics and Material Science Department, Brookhaven National Laboratory , Upton, NY , USA

2. Department of Material Science and Engineering, Technion - Israel Institute of Technology , Haifa , Israel

3. Department of Physics and Astronomy, University of Denver , Denver, CO , USA

4. GFMC, Departamento de Física de Materiales, Facultad de Física, Universidad Complutense , Madrid , Spain

5. Department of Physics and Center for Advanced Nanoscience, University of California San Diego , La Jolla, CA , USA

6. Department of Physics, University of Oviedo , Oviedo , Spain

Publisher

Oxford University Press (OUP)

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